eWARP TKD: Ultra-Fast & High-Resolution Transmission Kikuchi Diffraction

eWARP TKD is the latest addition to the award-winning eWARP family of detectors, powered by Bruker’s cutting-edge Wide ARea Pixelated (WARP) sensor technology, and designed specifically for Transmission Kikuchi Diffraction (TKD).

With eWARP our unique WARP sensors began a new era of EBSD with ultra-fast mapping speeds at unprecedented spatial resolution and more. Leveraging the same breakthrough WARP technology, eWARP TKD is redefining the limits of TKD (also known as Transmission EBSD), opening new possibilities for high-resolution nanomaterial analysis.

At the core of the system is a newly developed pixelated sensor with 162 × 162 pixels and an active area exceeding 26 × 26 mm².

eWARP TKD is purpose-built for nanomaterials characterization using the "on-axis" sample-detector geometry in the Scanning Electron Microscope (SEM). eWARP TKD outperforms existing solutions across all key metrics, with unmatched sensitivity, speed, spatial resolution and data integrity.

eWARP TKD is a detector for our QUANTAX EBSD analytical system.

eWARP TKD redefines nanomaterials characterization in the SEM, delivering a powerful set of advantages for researchers and engineers working on nanomaterials:

Unmatched spatial resolution: Combined with a high-end FE-SEM, eWARP TKD delivers mapping at better than 2 nm spatial resolution.
Integrated Dark Field (DF) and Bright Field (BF) imaging at lightning speed: Enabled by eWARP’s patented on-chip binning technology.
Time resolved mapping during in-situ experiments: Rapidly acquire maps and images every few seconds to capture real-time microstructural evolution in electron-transparent samples during in-situ heating and mechanical testing.
No drift correction. Minimal artifacts: Thanks to low beam requirements and ultrafast mapping, eWARP TKD renders drift correction obsolete and produces maps with minimal drift induced artifacts.
Engineered for delicate samples: Extreme signal efficiency enables low-dose, low-kV TKD mapping for beam-sensitive materials.

Search

Last news

October 20, 2026

New nitrogen and protein analyzers of the exceed PLUS series...

HORIBA Launches the EMIA-20XC Carbon Analyzer for High-Carbon Materials, a New Addition to the EMIA-Expert Series

October 6, 2026

Highly repeatable carbon analysis of high-carbon materials to support R&D and stable manufacturing processes

Meet XFlash® 7200 FIRE, The New Hero of Elemental Analysis on SEM

September 4, 2026

EDS Webinar The Future of EDS Starts Here - Introducing inclined 4-Channel Detection