Innovative scanning probe microscopy (SPM) products offering extraordinary levels of performance, value, and ease-of-use for a wide range of application from surface topography to a wide variety of nanoscale surface property measurements.
Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.
Automatic tuning of amplitude, contact force, scan speed, and feedback gains
(Various tuning modes including Auto, Fast, Soft, Rough, Flat, and Point)
Operating instructions; Tab structure (Measurement/ Analysis); Movable scopes/ Measurement area tracking; Batch processing; and Tip calibration