Scanning Electron Microscope FlexSEM 1000

Scanning Electron Microscope FlexSEM 1000

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The FlexSEM 1000 is a compact variable-pressure SEM that delivers the performance of a conventional SEM in a lab-friendly footprint, and requires only a standard wall outlet for power.

  • Best-in-class resolution in a compact system. The FlexSEM has employed a newly designed electrical optical system and reliability-proven high-sensitivity detector, achieving imaging at 4 nm.
  • Novel low vacuum technologies enable observation of non-conductive specimens without preprocessing.
  • The user interface is easy to operate even by novice users, and with the various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience level. Specifically, the new and enhanced navigation function, SEM MAP, helps locate the regions of interest quickly, and delivers accurate correlated optical and SEM images using only one click.

Sample: Cement
Sample: Cement
Magnification: 40,000x
Accelerating Voltage: 3 kV
Signal: Secondary Electron (SE)
Without metal coating

Sample: ZnO
Sample: ZnO
Magnification: 150,000x
Accelerating Voltage: 5 kV
Signal: Secondary Electron (SE)
Without metal coating

Sample: Polymer Cross Section
Sample: Polymer Cross Section
Magnification: 13,000x
Accelerating Voltage: 5 kV
Vacuum: 50 Pa
Signal: Ultra Variable-Pressure Detector (UVD) Without metal coating

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