Scanning Electron Microscope SU3500

Scanning Electron Microscope SU3500


Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at low pressures. The SU3500 is sure to be the workhorse in any laboratory.

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.

Unparalleled Image Quality

All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.

Intuitive Operation

Wide-screen GUI and fast auto image optimization functions (7 seconds) via “delegation” technology.

Ultra Variable-Pressure Detector

Image surface information at low vacuum and low accelerating voltages.

Stereoscopic Image Function

Point and click for seamless, real-time “3D” image observation.


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