Revolutionary Physical Properties Thin Film Characterization System
The LINSEIS Thin Film Analyzer is the perfect tool to characterize a broad range of thin film samples in an extremely comfortable and fast way. It is an easy to use, single stand alone system and delivers highest quality results using a patent pending measurement design.
The big advantage of this system is the simultaneous determination of a broad range of physical properties within one measurement run. All measurements are take in the same (in-plane) direction and are very comparable.
Main System Characteristics:
High quality, easy to use characterization system for thin films (nm to µm range).
Temperature dependent measurements (-170 to 200°C – optional 300°C).
Easy sample preparation and handling.
High measurement flexibility (sample thickness, sample resistivity, deposition methods).
All measurements are taken from same sample in one run.
It is possible to measure samples with metallic behavior as well as ceramics or organics.
Consists of measurement chamber, vacuum pump, basic sample holder with included heater, measurement electronics, system integrated lock-in amplifier, electronics and evaluation software for 3w-method, PC and LINSEIS Software package. The design is optimized to measure following physical properties:
λ – Thermal Conductivity (steady state & transient / in plane)
The LINSEIS L75 PT Quattro Dilatometer is a very unique instrument, which was developed for customers which have to deal with a large amount of samples. The Quattro Dilatometer is built up with four separate dilatometer measuring sensors, which can measure simultaneously either four separate samples at one time, or three separate samples against a reference standard.
That means, the productivity of the Quattro Dilatometer is three times as high as compared to the normally used dual push rod dilatometers. With a dual push rod dilatometer only one sample can be measured against the standard at each time.
Another feature included in this Quattro Dilatometer is an automatic furnace lift mechanism. This feature automatically lifts the furnace at the end of each measurement without any operator interaction. This allows the user to insert new samples while the furnace is still cooling down, when a second or third furnace is mounted on the system the sample throughput can be even further increased significantly.
The Quattro Dilatometer uses a unique amplifier with automatic zero setting for all four samples. Furthermore there is a “manual push rod speed release” for each sample. With this feature all four samples can easily be changed and seated correctly for high accuracy measurements.
We are proud to say that as far as we know Linseis is the only supplier worldwide, that can offer this highly specialized dilatometer. This is another example of our powerful line of thermal analysis instruments.